Instrumentation

JEOL  JEM-2200FS

     Energy Filtered Transmission Electron MicroscopeJEM2200FS

 

  • Schottky Thermal Field Emitter Source
  • Oxford 80mm2 X-Max Energy Dispersive X-ray Spectrometer (EDS)
  • Scanning Transmission Electron Microscopy with HAADF
  • Electron Tomography (TEMT)

 

JEOL  JEM-2000FX

     Transmission Electron MicroscopeJEM2000FX
 

  • LaB6 Source
  • 200kV Acceleration Voltage

 

FEI/ThermoFisher TecnaiT12

     Transmission Electron MicroscopeT12
 

  • LaB6 Source
  • 80-120kV Acceleration Voltage
  • Cryo-Transfer

 

FEI/ThermoFisher  Magellan 400 XHR-SEM

     Scanning Electron MicroscopeMagellan 400

 

  • Schottky Thermal Field Emitter Source
  • Oxford 80mm2 X-Max Energy Dispersive X-ray Spectrometer (EDS)
  • Low-Voltage Scanning Transmission Electron Microscopy with HAADF
  • Electron Backscattering Diffraction (EBSD)

 

Coming Soon

VP-SEM

     Scanning Electron MicroscopeVPSEM

 

  • Schottky Thermal Field Emitter Source
  • Energy Dispersive X-ray Spectrometer (EDS)

Asylum MFP-3D

     Scanning Probe MicroscopeAsylum MFP-3D

 

  • Contact/Tapping Mode

 

Brucker (Digital Instruments) Dimensions 3100

     Scanning Probe MicroscopeDimensions 3100

 

  • Nanoscope IIIa Controller
  • Tapping Mode
  • Contact Mode

 

Brucker (Digital Instruments) MultiMode

     Scanning Probe MicroscopeMultiMode

 

  • Nanoscope IV Controller
  • Tapping Mode
  • Contact Mode

 

Leica Ultracut UCT EM FCS

     Cryo-UltramicrotomeUCT


 


Leica (Reichert & Jung) ULTRACUT

     UltramicrotomeUltraCut


 

FEI Vitrobot MKII

     Plunge FreezerVitroBot


 

Balzers Critical Point Dryer

     Critical Point Dryer

CPD


 

Cressington 108 Sputter Coater

 

 

     Sputter CoaterCSC108

 

 


 

Cressington 208 Sputter Coater

     Sputter CoaterCSC208